Base System
These products are included with every Sentris system.
Infrasight Camera Series
PN0357, PN0620 are used for semiconductor device failure analysis circuit board failure analysis, and microscopic temperature measurement and analysis of materials.
IS640 20 micron Lens
PN0116 provides 20µm/pixel spatial resolution and 12.8 x 9.6 mm field-of-view at a working distance of 31 mm
IS640 80 micron Lens
PN0119 provides 80µm/pixel spatial resolution and 51.2 x 38.4 mm field-of-view at a working distance of 69 mm.
Thermalyze Image Analysis Software
PN0177 provides an extensive set of analysis tools to help you characterize the performance of electronic and micro-mechanical devices.
Lock-in Thermography Software Module
PN0172 (LIT) is a process of automatically and repeatedly powering an electronic device at regular intervals while thermal images of the device are analyzed by software.
System Computers
A fully configured computer system for Sentris which includes all hardware and software preinstalled and tested.
Add Additional Lenses
IS640 Macro Lens
PN0120 has an adjustable focus and working distance range of 100 mm out to infinity. The maximum spatial resolution is 140µm/pixel.
IS640 40 micron Lens
PN0117 provides 40µm/pixel spatial resolution and 25.6 x 19.2 mm field-of-view at a working distance of 27 mm.
IS640 10 micron Lens
PN0653 provides 10µm/pixel spatial resolution and 6.4 x 4.8 mm field-of-view at a working distance of 20 mm.
IS640 5 micron Lens
PN0118 provides 5µm/pixel spatial resolution and 3.2 x 2.4 mm field-of-view at a working distance of 19.5 mm. *not radiometric*
Add Additional Software Functionality
Thermalyze Seat License USB Dongle
PN0178 is required for IS640-17 USB3 cameras and for additional Thermalyze software seats.
Thermal Model Comparison Software Module
PN0310 (TMC) tests are used to troubleshoot populated circuit board to detect and locate short circuits, open circuits, faulty components, and stressed components.
Add a Camera Positioning System
Camera Positioning System Manual Z 450
PN0314 enables fine positioning of a thermal camera along the Z-axis.
Camera Positioning System Manual Z 600
PN0267 enables fine positioning of a thermal camera along the Z-axis.
Camera Positioning System Auto Z 600
PN0303 enables fine positioning of a thermal camera along the Z-axis. The motorized Z stage enables homing and the ability to reposition the cameras automatically to known, precise positions.
Camera Positioning System Auto XYZ 600
PN0250 enables fine positioning of a thermal camera and a probing camera. Motorized X, Y and Z stages enable homing and the ability to reposition the cameras automatically to known precise positions. Manual Z camera stages enable fine focusing and matching thermal and probing camera working distance.
Camera Positioning System Auto XYZZ 600
PN0789 enables fine positioning of a thermal camera and a probing camera. Motorized X, Y and Z stages enable homing and the ability to reposition the cameras automatically to known precise positions. Manual Z camera stages enable fine focusing and matching thermal and probing camera working distance.
Camera Positioning System Auto XYZ 750
PN0410 enables fine positioning of a thermal camera. Motorized X, Y and Z stages enable homing and the ability to reposition the cameras automatically to known precise positions. Manual Z camera stages enable fine focusing and matching thermal and probing camera working distance.
Camera Positioning System Auto XYZ Desktop
PN0480 is a portable and compact camera positioning system. The system's lightweight design allows for easy lifting using the handle along the z-axis. Motorized X, Y and Z stages enable homing and the ability to reposition the cameras automatically to known precise positions.
Add Device Testing Components
Device Positioning Stage Manual XY 100 x 160mm
PN0253 enables small components to be precisely moved and positioned within the camera’s field of view.
Device Probing Chuck
PN0418 is used to secure devices for testing using the included device clamps or optional vacuum pump.
Thermoelectric Vacuum Chuck Equipment
PN0254 is used to hold and heat/cool devices under test. It includes a thermoelectric vacuum chuck thermoelectric controller, vacuum controller, and a liquid heat exchanger.
Device Probing Equipment
PN0258 provides a sturdy base on which to probe and power semiconductor devices.
Device Flip Probing Platform
PN0335 is used to probe a device or wafer and flip to image the opposite side.
Flip Platform Device Window
PN0746 sits in the opening of [PN0335] Device Flip Probing Platform and is used to hold a device over a germanium window, which is transparent in the infrared wavelengths. Thus, if [PN0335] is flipped, the opposite side of the device can be imaged with a thermal camera.
Flip Platform Device Clamp
PN0715 sits in the opening of [PN0335] Device Flip Probing Platform and is used to hold a device. Thus, if [PN0335] is flipped, the opposite side of the device can be imaged with a thermal camera.
Device XYZ Needle Probe Set
PN0263 enables precise positioning of needle probes onto semiconductor pads. Each probe has a magnetic base and can be adjusted in the x, y, and z directions with +/- 7.5 mm movement along each axis.
Device Probing Camera Manual XYZ
PN0283 displays small areas on electronic devices when making electrical connections using probes. The camera can also be used to capture images of the unit under test for use with the Picture Overlay software tool.
Device Probing Microscope Camera
PN0293 displays small areas on electronic devices when making electrical connections using probes. The camera can also be used to capture images of the unit under test for use with the Picture Overlay software tool.
8 Module Input Output Device
PN0616 is an I/O device with 8 channels to control and monitor relays.
Emissivity Coating Equipment
PN0307 can be used to increase emissivity of devices for junction temperature estimation, lock-in thermography testing, and to create uniform surface emissivity.
Thermal Test Chip
PN0308 is a 2.5 x 2.5 mm silicon semiconductor die enclosed in a 15.24 x 31.5 mm ceramic 24 pin DIP package. Test chips can be very useful when training system users to perform tests such as lock-in thermography.
Add Circuit Board Testing Components
Camera Positioning Arm Manual XY
PN0292 adjusts to any position in the XY direction and can mount to multiple vertical stages.
Circuit Board XYZ Spring Probe Set
PN0295 is used to make electrical contact with circuit board traces, vias, and component leads.
Circuit Board Probing Camera Manual XYZ
PN0294 allows the probing camera to be manually positioned in any orientation when probing both circuit boards and semiconductor devices.
Barcode Scanner
PN0065 is a text input device used to scan device barcodes. Barcode data can be used to save Lock-in Thermography and Thermal Model Comparison test files.
Add System Enclosure
System Enclosure 600
PN0287 provides a stable environment for improved test sensitivity by blocking the thermal noise emitted by the ambient environment and blocking air currents generated by heating and air conditioning vents.
System Enclosure 750
PN0412 is designed for failure analysis of large circuit boards up to 600 x 500 mm. The anodized aluminum framed enclosure provides a stable environment to perform sensitive lock-in thermography and model comparison tests by blocking ambient thermal noise and air currents.
Add System Equipment Racks & Accessories
System Equipment Racks & Accessories
19-inch standard equipment racks and accessories are used to store and use rack mountable components.
Add System Safety Accessories
Motor Controller Safety Kit
PN0614 contains an emergency stop button and motor controller jog remote with both local and online control.
Add System Warranty
Sentris Warranty, Additional 1 Year
PN0326 adds one additional year to the existing Sentris system one-year warranty. Unit Price is 10% of total system list price.
Add Replacement Consumable Parts
The following components are considered consumable and can be purchased as needed.
