Sentris
Electronics Failure Analysis System

Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.

Using a non-destructive process called lock-in thermography, failures can be isolated on both bare (front or backside) and packaged devices without the need for surface treatment or coating. Sentris can also locate low-power fail sites on SMD components, such as capacitor leakage. The x, y position of defect sites can be located, as well as defect depth. Depth analysis can be very helpful when isolating faults in stacked die packages.

In addition to fault isolation, Sentris also includes thermal analysis tools for true temperature mapping, junction temperature measurement, die attach evaluation, and thermal resistance evaluation.

Contact us with information about your application for a Sentris quote

                Included Components

                Sentris is supplied as a complete, fully tested system that includes all of the following components:

                Camera Components

                • [PN0102] IS640 Camera, Grade 1, 60Hz

                • [PN0116] IS640 20 micron Lens

                • [PN0119] IS640 80 micron Lens 

                Supporting Components

                • [PN0143] System Computer

                • [PN0276] Sentris Manual 

                • [PN0333] Sentris Toolbox 

                Software Components

                • [PN0177] Thermalyze Image Analysis Software

                •  [PN0172] Lock-in Thermography Software Module

                Optional Components

                The following components offer additional functionality to Sentris:

                Camera Components

                • [PN0103] IS640 Camera, Grade 1, 7.5Hz

                •  [PN0120] IS640 Macro Lens

                • [PN0117] IS640 40 micron Lens

                • [PN0118] IS640 5 micron Lens

                Supporting Components

                • [PN0253] Device Positioning Stage Manual XY 100 x 160mm

                • [PN0314] Camera Positioning System Manual Z 450

                • [PN0267] Camera Positioning System Manual Z 600

                • [PN0303] Camera Positioning System Auto Z 600

                • [PN0250] Camera Positioning System Auto XYZ 600

                • [PN0287] System Enclosure 600

                • [PN0254] Thermoelectric Vacuum Chuck Equipment

                • [PN0258] Device Probing Equipment

                • [PN0300] Device Flip Probing Equipment

                • [PN0263] Device XYZ Needle Probe Set

                • [PN0295] Circuit Board XYZ Spring Probe Set

                • [PN0293] Device Probing Microscope Camera Manual Y

                • [PN0294] Circuit Board Probing Camera Manual XYZ

                • [PN0266] High Frequency Relays

                • [PN0167] High Current Relays

                • [PN0307] Emissivity Coating Equipment

                •  [PN0308] Thermal Test Chip

                • [PN0326] Sentris Warranty, Additional 1 Year

                Software Components

                • [PN0310] Model Comparison Software Module

                • [PN0178] Thermalyze Offline USB License Key

                Replacement Components

                • [PN0279] Probe Needles, 0.5 x 19mm, Set of 10

                • [PN0309] Mini Banana Plugs, Set of 10

                • [PN0169] High Frequency Relay Module

                • [PN0337] Emissivity Coating Polymer 100ml

                • [PN0338] Emissivity Coating Solvent 100ml

                Our systems are a fraction of the cost of competing MWIR systems

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