Optotherm manufactures cost-effective, turn-key infrared imaging systems for electronics failure analysis, fault isolation, and temperature measurement applications including:
- Lock-in thermography fault isolation
- Photon emission testing
- Junction temperature measurement
- Active device transient temperature analysis
- PCB troubleshooting
Sentris is Optotherm's product line of infrared imaging systems. Each system is configured for specific applications.
Optotherm designs and manufactures the primary Sentris system components including infrared cameras and lenses, optical assemblies, test equipment, and image analysis and testing software.
Explore Sentris System Configurations
Sentris FA-MW
MWIR Lock-in Thermography IC Failure Analysis
- Detect localized heating below 0.0001 °C on semiconductor devices and small circuit boards caused by leakage current and resistive shorts.
- Incorporates our cryogenic cooled MWIR camera with sensitivity <20 mK and resolution of 2 µm.
Sentris FA-LW
LWIR Lock-in Thermography IC Failure Analysis
- Detect localized heating below 0.001 °C on semiconductor devices and small circuit boards caused by leakage current and resistive shorts.
- Incorporates our uncooled LWIR camera with sensitivity <30 mK and resolution of 5 µm.
Sentris FA-SW
SWIR Photon Emission IC Failure Analysis
- Detect faults on bare semiconductor devices that emit short-wavelength infrared (SWIR) photons.
- Incorporates a cooled SWIR camera with resolution of 300 nm.
Sentris RD-MW
MWIR Thermal Microscopy for Research & Development
- Measure the temperature of operating semiconductor devices, MEMS devices, micro medical devices, and small-scale materials.
- Incorporates our cryogenic cooled MWIR camera with sensitivity <20 mK and resolution of 2 µm.
Sentris PCB-LW
LWIR Printed Circuit Board Troubleshooting
- Detect and locate faults on bare and populated circuit boards using Lock-in Thermography and Model Comparison.
- Incorporates our new cooled LWIR camera with sensitivity <30 mK and resolution of 30 µm.
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