Product applications
Semiconductor Device Failure Analysis
Detect and locate leakage current and resistive shorts on semiconductor die and packages using lock-in thermography
Circuit Board Failure Analysis
Detect and locate short circuits on bare boards and power-to-ground shorts on populated boards using lock-in thermography
Microscopic Thermal Imaging
View and analyze microscopic temperature distribution on electronics, materials, MEMS, and medical devices
Sentris
Electronics Failure Analysis System
Detect and locate leakage current and resistive shorts on semiconductor devices and circuit boards using lock-in thermography
Micros
Thermal Analysis System
View and analyze microscopic temperature distribution on electronics, materials, MEMS, and medical devices