System Components

System component pages include technical data sheets, setup instructions, and operation information.

  • Infrared Cameras
  • Optical Assemblies
  • Software
  • System Computers
  • Camera Positioning
  • Device Positioning
  • Device Testing
  • Circuit Board Testing
  • Accessories
LW320-12 LWIR Camera
Includes:
-Radiometric infrared camera with calibration certificate
-Shock resistant storage case
-Lens cleaning kit
-5m USB3.0 cable
Micros Camera Positioning System Auto Z 300
Includes the following:
300x300mm optical breadboard
200mm travel auto linear z stage
Motor controller with software control
IS320-12 Camera Bracket
Micros Thermal Imaging Microscope Systems
Non-contact temperature measurement of features as small as 2 microns on electronic devices, MEMS, materials, and medical devices.
Sentris Electronics Failure Analysis Systems
Lock-in Thermography
Detect and locate low-level heating associated with leakage current and resistive shorts in semiconductors and printed circuit boards.
​ Lock-in Photometry
Detect photon emissions associated with semiconductor faults such as latch-ups and gate oxide defects. ​
IS640-17 LWIR Lenses
LWIR lenses designed for the IS640 and IS640-17 LWIR cameras for microscopic and macroscopic temperature measurement, Lock-in Thermography testing, and Model Comparison testing.
LW320-12 LWIR Lenses
Compatibility:
-LW320-12 LWIR Camera
SW640-5 SWIR Lenses
SWIR lenses for the SW640-5 SWIR camera for microscopic and macroscopic analysis and Lock-in Photometry testing.
MW640-15 MWIR Lenses
MWIR lenses for the MW640-15 MWIR camera for microscopic temperature measurement and analysis of features down to 3µm in size