System Components

 System component pages include technical data sheets, setup instructions, and operation information.

Public Pricelist
  • Infrared Cameras
  • Optical Assemblies
  • Software
  • Camera Positioning
  • Device Positioning
  • Device Testing
  • Circuit Board Testing
  • Accessories
Micros Thermal Imaging Microscope Systems
Non-contact temperature measurement of features as small as 2 microns on electronic devices, MEMS, materials, and medical devices.
Sentris Electronics Failure Analysis Systems
Lock-in Thermography
Detect and locate low-level heating associated with leakage current and resistive shorts in semiconductors and printed circuit boards.
​ Lock-in Photometry
Detect photon emissions associated with semiconductor faults such as latch-ups and gate oxide defects. ​
IS640-17 LWIR Lenses
Infrared lenses for microscopic and macroscopic temperature measurement.
Compatibility:
-IS640 LWIR Camera
-IS640-17 LWIR Camera
LW320-12 LWIR Lenses
Infrared lenses for microscopic temperature measurement.
Compatibility:
-LW320-12 LWIR Camera