Optotherm manufactures affordable, high-performance infrared imaging systems specifically designed for electronics failure analysis, fault isolation, and temperature measurement applications including:

• Lock-in thermography fault isolation
• Photon emission testing
• Junction temperature measurement
• Active device transient temperature analysis
• PCB troubleshooting

Sentris is Optotherm's product line of infrared imaging systems, each configured for specific applications. Each system is configured by specific analysis methods and platforms.

Optotherm designs and manufactures the primary Sentris system components including infrared cameras and lenses, optical assemblies, test equipment, and image analysis and testing software.

Optotherm Sentris systems enable engineers to:

• Detect and localize leakage current and resistive shorts on semiconductor devices and small circuit boards
• Detect faults on bare semiconductor devices that emit short-wavelength infrared (SWIR) photons.
• Analyze operating temperatures on active devices including junction temperature measurement and transient analysis. 
• Detect and locate faults on bare and populated circuit boards using Lock-in Thermography and Model Comparison.