System Components

-Description-
Allows the probing camera to be manually positioned in any orientation

-Included Components-
camera, lens, articulating arm

-Features-
Provides 600 mm reach

-More Information-
https://www.optotherm.com/shop/1160

Included:
- Vibration isolation mounts
- Mounting table rulers

Position a single camera to perform microscopic testing on a device.
Includes 600x600mm optical mounting table, manual Z axis stage, ESD Mat, and system toolbox.

Product Information: https://www.optotherm.com/pn0271

Product Information: https://www.optotherm.com/pn0273

Product Information: https://www.optotherm.com/pn0266

Product Information: https://www.optotherm.com/pn0257

Product Information: https://www.optotherm.com/pn0256

Product Information: https://www.optotherm.com/pn0255

-Description-
Secure devices under test with vacuum pressure and heat or cool them with the integrated thermoelectric chuck.

-Included Components-
Thermoelectric Peltier vacuum chuck, spring-loaded device clamps, and Thermoelectric vacuum controller with vacuum controls and liquid heat exchanger.

-Features-
80x80mm Thermoelectric chuck with vacuum rings and 0-150°C range, 24VDC low voltage operation

-More Information-
https://www.optotherm.com/shop/1116

-Description-
Manual XY translation stage for positioning devices and small circuit boards

-Included Components-
XY translation stage and mounting hardware for metric mounting tables

-Features-
100x160mm platform with M4-0.7mm mounting holes on 25mm centers and ±35mm travel with 0.1mm graduations

-More Information-
https://www.optotherm.com/shop/1115

Product Information: https://www.optotherm.com/pn0251

Includes 600x600mm optical mounting table, motorized X, Y, and Z axis stages, manual Z axis stages, linear stage motor controllers & safety kit, ESD Mat, and system toolbox.

-Description-
License to use Thermalyze Image Analysis Software on your own PC. Can be used for additional Thermalyze software seats to analyze test and image data.

-Included Componenets-
USB Dongle License

-Description-
Non-destructive (NDT) thermal imaging method for failure analysis (FA) and semiconductor diagnostics.

-Features-
Temperature sensitivity down to <1 mK (LWIR) / <100 µK (MWIR)
Power sensitivity below 10 µW (LWIR) / 1 µW (MWIR)
Excitation frequency range from <1 Hz to 15 Hz
Integrated control of Keithley SMUs and programmable power supplies

-More Information-
https://www.optotherm.com/shop/972

*Lock-in Thermography requires an instrument to perform device bias. Device bias is typically accomplished by connecting the output of a power supply or source meter to exposed leads or pins of package devices or circuit boards, or by landing probes on bare semiconductor devices or circuit boards. A number of Keithley instruments can be directly controlled by Thermalyze software during LIT tests to cycle bias on and off. Refer to the Thermalyze.chm Help file for a list of supported Keithley instruments. *

Includes:
- Grounding wrist strap
- Common ground cord