Overview
Applications
- Leakage current on bare and packaged semiconductor devices
- Resistive shorts on circuit boards
- Power-to-ground short circuits on small populated circuit boards
Features
- Camera sensitivity (NETD) <40mK
- Lock-in Thermography heat detection down to 0.001 °C
- Available lenses: 5 µm, 10 µm, 20 µm, 40 µm, 80 µm, and focusable WFOV
- Defect depth analysis of stacked die and packaged semiconductor devices
- Microscopic temperature measurement and analysis
Base System Components
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
Optional Components
System Computers and Software
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
LWIR Lenses
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
Camera Positioning Components
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
Electronic Device & Mini PCB/PCBA Testing Equipment
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
System Enclosures & Equipement Racks
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.
System Warranty
Your Dynamic Snippet will be displayed here... This message is displayed because you did not provided both a filter and a template to use.