Non-destructive (NDT) thermal imaging method for failure analysis (FA) and semiconductor diagnostics.
- Temperature sensitivity down to <1 mK (LWIR) / <100 µK (MWIR)
- Power sensitivity below 10 µW (LWIR) / 1 µW (MWIR)
- Excitation frequency range from <1 Hz to 15 Hz
- Integrated control of Keithley SMUs and programmable power supplies
Product Information: https://www.optotherm.com/shop/972