Overview
The front half of the enclosure has been omitted in the above photos.
Applications
Failure Analysis
- P-N junction leakage
- Gate oxide leakage
- Latch-up sites
- Transistor failure caused by an open or short circuit
Development
- Active device emission analysis
Features
- InGaAs camera sensitivity from 0.9 to 1.7 µm
- Available lenses: 50X (300 nm), 20X, 10X, 5X, 2X, and 1X
- Lock-in Photometry increases signal/noise ratio of photon detection
Base System Components
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Optional Components
System Computers and Software
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SWIR Lenses
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Camera Positioning Components
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Electronic Device & Mini PCB/PCBA Testing Equipment
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System Enclosures & Equipment Racks
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System Warranty
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