Sentris RD-MW

Active Semiconductor Device Analysis

  • Analyze operating temperatures on active devices including junction temperature measurement and transient analysis. 
  • Incorporates our cryogenic cooled MWIR camera with sensitivity <20 mK and resolution of 2 µm.
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Explore this Sentris System

OverviewApplicationsFeaturesBase System ComponentsOptional Components

Overview

Applications

  • Active device spot temperature measurement
  • Junction temperature measurement
  • Transient temperature analysis

Features

  • Camera sensitivity (NETD) <20 mK
  • Available lenses: 2 µm, 5 µm, 20 µm, and 80 µm
  • True temperature measurement using emissivity tables
  • Maximum frame rate 1550 Hz

Base System Components

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Optional Components

Additional System Computer

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MWIR Lenses

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Camera Positioning Components

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Electronic Device & Mini PCB/PCBA Testing Equipment

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System Enclosures & Equipment Racks

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System Warranty

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