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Sentris FA-MW
MWIR Lock-in Thermography IC Failure Analysis
Sentris FA-LW
LWIR Lock-in Thermography IC Failure Analysis
Sentris FA-SW
Photon Emission IC Failure Analysis
Sentris RD-MW
Active Semiconductor Device Analysis
Sentris PCB-LW
LWIR Printed Circuit Board Troubleshooting
Sentris System Comparison
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Electronics Test Probes & Fixtures
Equipment to secure, position, probe, and test electronic devices and circuit boards
Circuit Board Flip Fixture
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Device Flip Probing Platform
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Flip Platform Device Clamp
For use with Device Flip Probing Platform
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Flip Platform Device Window
For use with Device Flip Probing Platform
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Device XYZ Needle Probe Set
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Probe Needles Sets
For use with Device XYZ Needle Probe Set
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Circuit Board XYZ Spring Probe Set
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Spring Tip Probe Needles
For use with Circuit Board XYZ Spring Probe Set
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