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    Sentris FA-MW

    MWIR Lock-in Thermography IC Failure Analysis

    Sentris FA-LW

    LWIR Lock-in Thermography IC Failure Analysis

    Sentris FA-SW

    Photon Emission IC Failure Analysis

    Sentris RD-MW

    Active Semiconductor Device Analysis

    Sentris PCB-LW

    LWIR Printed Circuit Board Troubleshooting

     Sentris System Comparison

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3 Articles
Research References ×
Research References: Semiconductor Failure Analysis & Reliability
Optotherm infrared imaging systems have been mentioned in peer-reviewed publications featuring semiconductor device reliability...
Research References
Feb 26, 2026
Research References: Photonics and Optical Technologies
Optotherm infrared imaging systems have been mentioned in peer-reviewed publications featuring photonic device development and evaluation...
Research References
Feb 26, 2026
Research References: Nanomaterials & Materials Science
Optotherm infrared imaging systems have been mentioned in peer-reviewed publications featuring nanomaterials research, materials characterization, and microscale thermal analysis...
Research References
Feb 26, 2026
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