Sentris Electronics Failure Analysis Systems
Lock-in Thermography
Detect and locate low-level heating associated with leakage current and resistive shorts in semiconductors and printed circuit boards.
Lock-in Photometry
Detect photon emissions associated with semiconductor faults such as latch-ups and gate oxide defects.
Sentris was developed in 2017 to perform failure analysis on decreasing integrated circuit feature sizes and supply voltages. Sentris pinpoints low-level infrared thermal emissions from faults such as short circuits and leakage current.
Using a non-destructive process called Lock-in Thermography, failures can be isolated on packaged devices, SMD components, PCBs, and PCBAs without the need for surface treatment or coating.
In addition to fault isolation, Sentris also includes thermal analysis tools for true temperature mapping, junction temperature measurement, die attach evaluation, and thermal resistance evaluation.
Optotherm's systems are turnkey solutions, in that we provide components such as linear stages, brackets, breadboards, enclosures, etc. to produce a full analysis system. The base Sentris system includes the camera, desired lenses, camera positioning system, and software. Optional components can be added for additional functionality.
Terms and Conditions
1 year standard warranty
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