System Components

System component pages include technical data sheets, setup instructions, and operation information.

Software & Analysis Capabilities

Software

Analyze the performance of electronic and micro-mechanical devices

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Lock-in Photometry Software Module
LIP is a tool similar to Emission Microscopy (EMMI) and Photon Emission Microscopy (PEM) and is used to detect and locate faults on semiconductor devices by detecting emitted photons in the short-wave infrared (SWIR) region of the electromagnetic spectrum.
Product Information: https://www.optotherm.com/shop/2152
Thermalyze Image Analysis Software
Developed by Optotherm, Thermalyze provides an extensive set of analysis tools to help you characterize the performance of electronic and micro-mechanical devices.
Product Information: https://www.optotherm.com/shop/1753
Model Comparison Software Module
MC is a process of comparing the thermal behavior of an electronic device to known operational devices as the devices are electrically exercised.
Lock-in Thermography Software Module
Non-destructive thermal imaging method for failure analysis and semiconductor diagnostics.
- Temperature sensitivity down to <1 mK (LWIR) / <100 µK (MWIR)
- Power sensitivity below 10 µW (LWIR) / 1 µW (MWIR)
- Excitation frequency range from <1 Hz to 15 Hz
- Integrated control of Keithley SMUs and programmable power supplies

Product Information: https://www.optotherm.com/shop/972