Sentris RD-LW

LWIR Thermal Microscopy for Research & Development

  • Measure the temperature of semiconductor devices and small circuit boards.
  • Incorporates our uncooled LWIR camera with with sensitivity <30 mK, resolution of 5 µm, and frame rate up to 60 Hz.
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Optotherm Sentris RD-MW Test Image

Explore this Sentris System

Overview

Applications

  • Leakage current on bare and packaged semiconductor devices
  • Resistive shorts on circuit boards
  • Power-to-ground short circuits on small populated circuit boards

Features

  • Camera sensitivity (NETD) <30 mK
  • Available lenses: 5 µm, 10 µm, 20 µm, 40 µm, 80 µm, and focusable WFOV
  • True temperature measurement using emissivity tables
  • Maximum frame rate 60 Hz

Base System Components

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Optional Components

Additional System Computer

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LWIR Lenses

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Camera Positioning Components

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Electronic Device & Mini PCB/PCBA Testing Equipment

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System Enclosures & Equipment Racks

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System Warranty

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