Sentris RD-MW

MWIR Thermal Microscopy for Research & Development

  • Measure the temperature of operating semiconductor devices, MEMS devices, micro medical devices, and small-scale materials.
  • Incorporates our cryogenic cooled MWIR camera with sensitivity <20 mK, resolution down to 1 µm, and frame rate up to 1000 Hz
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Optotherm Sentris RD-MW Test Image

Explore this Sentris System

Overview

Applications

  • Active device analysis
  • Junction temperature measurement
  • High frame rate analysis
  • MEMS device measurement
  • Micro medical device measurement
  • Small-scale material analysis

Features

  • Camera sensitivity (NETD) <20 mK
  • Available lenses: 2 µm, 5 µm, 20 µm, and 80 µm
  • True temperature measurement using emissivity tables
  • Maximum frame rate 1550 Hz

Base System Components

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Optional Components

Additional System Computer

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MWIR Lenses

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Camera Positioning Components

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Electronic Device & Mini PCB/PCBA Testing Equipment

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System Enclosures & Equipment Racks

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System Warranty

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