Sentris IC

Using a non-destructive process called Lock-in Thermography, failures can be isolated on both bare (front or backside) and packaged devices without the need for surface treatment or coating. Sentris IC can also locate low-power fail sites on SMD components, such as capacitor leakage. The x, y position of defect sites can be located, as well as defect depth. Depth analysis can be very helpful when isolating faults in stacked die packages.


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Mounting Configurations

Specifications

Setup & Assembly

    Basic Mounting Configurations

All configurations can be modified. To configure a system from scratch, go to Sentris System Components.

Sentris IC 450-Z

Features:

  • Low-profile, compact design

  • Automated or manual Z axis

  • 450x450mm mounting table

Applications: 

  • Semiconductor device failure analysis

Compatibility: 

  • LWIR IS640-17 (single lens or turret)

  • SWIR SW640-5 (with Univid video microscope, single lens or turret)

  • MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC 600-Z

Features:

  • Larger workspace

  • Automated or manual Z axis

  • 600x600mm mounting table

Applications: 

  • Semiconductor device failure analysis

Compatibility: 

  • LWIR IS640-17 (single lens or turret)

  • SWIR SW640-5 (with Univid video microscope, single lens or turret)

  • MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC 600-XYYZ

Features:

  • Full automated XYZ thermal and probing camera positioning

  • 600x600mm mounting table

Applications: 
  • For applications that require the camera to be positioned at any location above a device 
  • Semiconductor device failure analysis
Compatibility: 

  • LWIR IS640-17 (single lens only)

  • Visual probing camera

Sentris IC 600-XYZZ

Features:

  • Rigid double carriage design

  • Camera travel: automated Z

  • Device platform travel: automated XY

  • 600x600mm mounting table

Applications: 

  • For applications requiring minimal camera movement and vibration, such as high lens magnification 

  • Semiconductor device failure analysis

  • Photon emission

  • Semiconductor inspection

  • Microscopic NIR infrared microscopy and SWIR microscopy

  • Applications requiring visible, NIR, and/or SWIR analysis

Compatibility:

  • LWIR IS640-17 (single lens or turret)

  • SWIR SW640-5 (with Univid video microscope, single lens or turret)

  • MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC Desktop-XYZ

Features:

  • Lightweight (10 kg)

  • Portable XYZ thermal camera positioning (automated or manual)

Applications: 

  • For applications that require portability

  • For applications where camera must be positioned on test equipment, where weight must be limited

  • Semiconductor device failure analysis

Compatibility: 

  • LWIR IS640-17 (single lens only)

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