
Sentris IC
Using a non-destructive process called Lock-in Thermography, failures can be isolated on both bare (front or backside) and packaged devices without the need for surface treatment or coating. Sentris IC can also locate low-power fail sites on SMD components, such as capacitor leakage. The x, y position of defect sites can be located, as well as defect depth. Depth analysis can be very helpful when isolating faults in stacked die packages.
Basic Mounting Configurations
All configurations can be modified. To configure a system from scratch, go to Sentris System Components.

Sentris IC 450-Z
Features:
- Low-profile, compact design
- Automated or manual Z axis
-
450x450mm mounting table
Applications:
- Semiconductor device failure analysis
Compatibility:
- LWIR IS640-17 (single lens)
- SWIR SW640-5 (with Univid video microscope, single lens or turret)
- MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC 600-Z
Features:
- Larger workspace
- Automated or manual Z axis
-
600x600mm mounting table
Applications:
-
Semiconductor device failure analysis
Compatibility:
- LWIR IS640-17 (single lens)
-
SWIR SW640-5 (with Univid video microscope, single lens or turret)
- MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC 600-XYYZ
Features:
- Full automated XYZ thermal and probing camera positioning
- 600x600mm mounting table
Applications:
- For applications that require the camera to be positioned at any location above a device
- Semiconductor device failure analysis
Compatibility:
- LWIR IS640-17 (single lens)
- Visual probing camera

Sentris IC 600-XYZZ
Features:
- Rigid double carriage design
- Camera travel: automated Z
- Device platform travel: automated XY
- 600x600mm or 900x600 mounting table
Applications:
- For applications requiring minimal camera movement and vibration, such as high lens magnification
- Semiconductor device failure analysis
- Photon emission
- Semiconductor inspection
- Microscopic NIR infrared microscopy and SWIR microscopy
- Applications requiring visible, NIR, and/or SWIR analysis
Compatibility:
- LWIR IS640-17 (single lens)
- SWIR SW640-5 (with Univid video microscope, single lens or turret)
- MWIR MW640-15 (single lens or turret): product release 2024

Sentris IC Desktop-XYZ
Features:
- Lightweight (10 kg)
-
Portable
XYZ thermal camera positioning (automated or manual)
Applications:
- For applications that require portability
- For applications where camera must be positioned on test equipment, where weight must be limited
- Semiconductor device failure analysis
Compatibility:
-
LWIR IS640-17 (single lens)
Specifications
Setup