ASM International | 2019
ASM International is a globally recognized professional society and leading authority in materials science and engineering. Its publication on Optotherm's Sentris system summarized the thermal imaging microscope as a tool for isolating IC faults. The article emphasized its use of lock-in thermography, its ability to pinpoint fault location and depth, and its integrated thermal analysis capabilities for comprehensive device evaluation.
ASL | 2012
ASL (Advanced Solutions Ltd.) is a distributor and technical solutions provider specializing in advanced instrumentation and equipment for research, development, and industrial applications. This article provides an overview of Optotherm's Sentris infrared microscope for failure analysis of devices and PCBs. It highlights the system’s applications in semiconductor device failure analysis, junction temperature measurement, thermal resistance measurement, die bond defect identification, logic circuit fault detection, and thermal analysis of MEMS and other components.
https://www.atsl.co.il/index.php/ir-microscopes/70-infrared-microscope
Fierce Sensors | 2012
https://www.fiercesensors.com/embedded/thermal-imaging-camera-from-optotherm
Photonics Spectra | 2009
Photonics Spectra is a leading industry magazine covering research, technology developments, products, and trends in optics, photonics, and imaging for scientists and engineers. This product listing outlines the system’s role in detecting and analyzing heat patterns on semiconductor devices, emphasizing its application in identifying hot spots, measuring junction temperature, and evaluating thermal performance.
https://www.photonics.com/Products/THERMAL-IMAGING-CAMERA/pr36303