EL Thermal Imaging System for Locating Shorts, Stressed Components, and Defects

Featured media coverage from leading semiconductor, photonics, and failure analysis magazines.

EL System

Optotherm's thermal Imaging System for quickly locating shorts, stressed components, and other defects, as well as analyzing the thermal behavior of individual components.


June 2014 — Read Announcement


July 2008 — Vision Systems Design

April 2007 — Vision Systems Design

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