System Components

System component pages include technical data sheets, setup instructions, and operation information.

  1. System Components
  2. Software & Analysis Capabilities
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Software & Analysis Capabilities

Software

Analyze the performance of electronic and micro-mechanical devices

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Lock-in Photometry Software Module
-Description-
Non-destructive (NDT) tool similar to Emission Microscopy (EMMI) and Photon Emission Microscopy (PEM) and is used to detect and locate faults on semiconductor devices by detecting emitted photons in the short-wave infrared (SWIR) region of the electromagnetic spectrum.

-More Information-
Product Information: https://www.optotherm.com/shop/2152


*Lock-in Photometry requires an instrument to perform device bias. Device bias is typically accomplished by connecting the output of a power supply or source meter to exposed leads or pins of package devices or circuit boards, or by landing probes on bare semiconductor devices or circuit boards. A number of Keithley instruments can be directly controlled by Thermalyze software during LIP tests to cycle bias on and off. Refer to the Thermalyze.chm Help file for a list of supported Keithley instruments. *
Thermalyze Image Analysis Software
-Description-
Developed by Optotherm, Thermalyze provides an extensive set of analysis tools to help you characterize the performance of electronic and micro-mechanical devices.

-More Information-
https://www.optotherm.com/shop/1753
Model Comparison Software Module
MC is a process of comparing the thermal behavior of an electronic device to known operational devices as the devices are electrically exercised.
Lock-in Thermography Software Module
-Description-
Non-destructive (NDT) thermal imaging method for failure analysis (FA) and semiconductor diagnostics.

-Features-
Temperature sensitivity down to <1 mK (LWIR) / <100 µK (MWIR)
Power sensitivity below 10 µW (LWIR) / 1 µW (MWIR)
Excitation frequency range from <1 Hz to 15 Hz
Integrated control of Keithley SMUs and programmable power supplies

-More Information-
https://www.optotherm.com/shop/972

*Lock-in Thermography requires an instrument to perform device bias. Device bias is typically accomplished by connecting the output of a power supply or source meter to exposed leads or pins of package devices or circuit boards, or by landing probes on bare semiconductor devices or circuit boards. A number of Keithley instruments can be directly controlled by Thermalyze software during LIT tests to cycle bias on and off. Refer to the Thermalyze.chm Help file for a list of supported Keithley instruments. *