Device XYZ Needle Probe Set
The XYZ Needle Probe (see Figure 1) enables precise positioning of needle probes onto semiconductor pads. Each probe has a magnetic base and can be adjusted in the x, y, and z directions with +/- 7.5 mm movement along each axis. The test arm can swivel and be adjusted in the z direction using a thumbscrew. The needle probe position on the test arm can also be adjusted using a thumbscrew. A wire lead with gold-plated contact pin is used to make electrical connection to the needle probe. Probes are offered in both left and right-hand versions. The right-hand version is shown in Figure 1.
Probe semiconductor die pads
Probe semiconductor package leads
Probe small circuit board components leads, pads, vias
Device XYZ needle probe set, +/- 7.5 mm travel, magnetic base, right and left handed
[PN0463] Probe Needles, Gold Plated, 0.5 x 19mm, Set of 10
||± 7.5 mm
Insert a probe needle into the tip of the test arm so that the blunt end of the needle does not protrude above the test arm.
Lens Damage: Microscopic lenses have short working distances and caution should be used when lowering the camera to prevent contacting the lens with the probe needles to avoid damage to the lens and anti-reflective coating.