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Micro Infrared Microscope

Detecting Hot Spots and Short Circuits

The InfraSight MI 320 infrared camera's high sensitivity, combined with sophisticated noise reduction and image enhancement software algorithms, provide the ability to detect and locate hot spots on semiconductors and MEMS devices that dissipate less than 1 milliwatt of power and that exhibit temperature rises of only 0.05°C.  During a short detection test, devices are typically powered for 5 to 10 seconds.  The I/O module provides a relay output to control power to the device.

 

 

 

Short Detection Settings

 

 

Test Averaging enables you to detect shorts with a resistance under 1 ohm.  Because low resistance shorts do not dissipate much power and heat, a series of tests are averaged together to increase test sensitivity.

 

The Auto Stop feature opens the I/O module relay, cutting off power to the device, as soon as the temperature on the short increases above a user-defined threshold.  This safety feature can prevent damaging the device, while still locating the short.

 

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