As electronic devices continue to decrease in size, heat
generation and thermal dissipation become increasingly important. The
Micro thermal microscope can
measure and display the temperature distribution over the surface of
semiconductor devices, enabling quick detection of hot spots and thermal
gradients which can indicate a defect site and frequently lead to
decreased efficiency and early failure.
In the
development of micro-electro-mechanical systems (MEMS), such as
microreactors, micro heat exchange systems, microactuators, and
microsensors, spatial temperature distribution and thermal response time
are among the most important parameters. Because a non-contact
approach is required to measure the temperature of MEMS components, the
Micro infrared microscope is a powerful tool for microthermographic
characterization, providing detailed thermographic images with 20μm
spatial resolution.
The Micro
infrared microscope can even be used to perform failure analysis on circuit boards. Defective and marginal components can be identified using a
proprietary software tool called Model Board Comparison and the Find Shorts
software tool helps detect and locate difficult-to-find short circuits.
sales@optotherm.com
Micro Infrared Microscope
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