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Applications

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Example Defects

Short Detection

Model Board Comparison

EL Software

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EL Infrared Circuit Board Inspection System

Electronics Failure Analysis and Functional Inspection

Many printed circuit board assembly defects cannot be identified easily using conventional methods such as ICT, FT, AOI, and AXI.  Such defects include the following:

  • Power-to-ground, low resistance and cable shorts

  • Stressed components

  • Faulty heat sink attachment

  • Programming errors

  • Defective BGAs, VCOs, and decoupling capacitors

Technicians and engineers spend many hours debugging boards with such defects.  Often, these boards end up in the scrap pile.  The EL infrared inspections system provides an alternative method of fault detection that can isolate these defects, thus filling the gaps between conventional test equipment.  EL is an effective and economical tool that can reduce debugging costs and minimize scrap.  When is used as the first screen of defective boards, EL can quickly provide useful troubleshooting information, dramatically reducing the time to repair.

 

Functional Inspection

EL can also be used to inspect boards for basic functionality.  Although EL cannot provide the same detailed level of functional verification as a functional test, it can provide verification of basic board operation.  Advantages of EL over traditional functional testers include low cost and fast setup.  No custom hardware is required and tests can usually be setup in less than an hour.  EL is ideal when the high cost of a dedicated functional tester cannot be justified.

 

Applications

  • Quickly locate shorts, stressed components, and other defects

  • Verify board functionality

  • Analyze the thermal behavior of individual components

  • Evaluate thermal management components

Software Features

  • Model Board ComparisonTM

  • Sophisticated detection algorithms to detect short circuits

  • Transparent picture overlay to locate defects

Camera Features

  • 0.05°C sensitivity

  • 320 x 240 uncooled infrared detector

  • 100 micron spatial resolution (minimum)

  • 30 frames/second thermal image capture and display

Enclosure Features

  • 27" x 27" x 45"  aluminum framed enclosure

  • Blocks stray infrared emittance by the ambient environment

  • Blocks air currents generated by heating and air conditioning ducts

  • Motorized infrared camera slide and controller precisely position the EL camera for Model Board Comparison and short circuit tests

  • Platform with adjustable PCB mounts enable repeatable positioning of board sizes up to 22" x 19"

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