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PRODUCTS
EL
 Introduction
Short
Detection
Model
Board Comparison
EL
Software
System Components
Specifications
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 sales@optotherm.com
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 EL
Electronics Failure Analysis
 Many printed
circuit board assembly defects cannot be identified easily using
conventional methods such as ICT, FT, AOI, and AXI. Such defects
include the following:
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Power-to-ground,
low resistance and cable shorts
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Stressed
components
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Faulty heat sink
attachment
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Programming errors
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Defective BGAs,
VCOs, and decoupling capacitors
Technicians and
engineers spend many hours debugging boards with such defects. Often,
these boards end up in the scrap pile. EL provides an alternative
method of fault detection that can isolate these defects, thus filling the
gaps between conventional test equipment. EL is an effective and
economical tool that can reduce debugging costs and minimize scrap.
Functional Verification
EL can also
be used to verify PCBA functionality. Advantages of EL over
traditional functional testers include low cost and fast setup. No custom
hardware is required and tests can usually be setup in less than an hour.
EL is ideal when the high cost of a dedicated functional tester cannot be
justified.
Applications
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Quickly locate shorts, stressed components, and
other defects
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Verify board
functionality
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Analyze the thermal behavior of individual
components
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Evaluate thermal management components
Software Features
Camera Features
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0.05°C sensitivity
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320 x 240 uncooled detector
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100 micron spatial resolution (minimum)
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30 frames/second image capture and display
Enclosure
Features
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27"
x 27" x 45" aluminum framed enclosure
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Blocks energy emitted by the ambient environment
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Blocks
air currents generated by heating and air conditioning ducts
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Motorized
camera slide and controller precisely position the EL camera for Model
Board Comparison and short circuit tests
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Platform
with adjustable PCB mounts enable repeatable positioning of board
sizes up to 22" x 20"
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